Structural pattern matching has gained a lot of attention the past decades by considering structures on features.
Matching structural features thus relies on underlying graph structures.
A simple metric on graphs P and Q can be defined by
where mcs denotes the maximum common subgraph.
This bounded distance satisfies the triangle inequality property (non-trivial proof, see ref below) but is NP-hard to compute.
Nevertheless it has been used successfully in applications.
@article{graphmetric-1998,
author = {Bunke, Horst and Shearer, Kim},
title = {A graph distance metric based on the maximal common subgraph},
journal = {Pattern Recogn. Lett.},
volume = {19},
number = {3-4},
year = {1998},
issn = {0167-8655},
pages = {255--259},
doi = {http://dx.doi.org/10.1016/S0167-8655(97)00179-7},
publisher = {Elsevier Science Inc.},
address = {New York, NY, USA}
}
Structural pattern matching has gained a lot of attention the past decades by considering structures on features. Matching structural features thus relies on underlying graph structures.
A simple metric on graphs P and Q can be defined by
where mcs denotes the maximum common subgraph.
This bounded distance satisfies the triangle inequality property (non-trivial proof, see ref below) but is NP-hard to compute.
Nevertheless it has been used successfully in applications.
@article{graphmetric-1998, author = {Bunke, Horst and Shearer, Kim}, title = {A graph distance metric based on the maximal common subgraph}, journal = {Pattern Recogn. Lett.}, volume = {19}, number = {3-4}, year = {1998}, issn = {0167-8655}, pages = {255--259}, doi = {http://dx.doi.org/10.1016/S0167-8655(97)00179-7}, publisher = {Elsevier Science Inc.}, address = {New York, NY, USA} }